TUM Technische Universit�t M�nchen
WALTER SCHOTTKY INSTITUTE Fundamental research in semiconductor electronics - WSI
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Silvia Baldovino

 
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Publications

Investigation of point defects at the high-k oxides/Si(100) interface by electrically detected magnetic resonance

JOURNAL OF NON-CRYSTALLINE SOLIDS 322 1-3 168-173 (2003)

S. Baldovino | S. Nokhrin | G. Scarel | M. Fanciulli | T. Graf | M. S. Brandt

Online Reference

Defect-related noise in AlN and AlGaN alloys

PHYSICA B-CONDENSED MATTER 308 69-72 (2001)

S. T. B. Goennenwein | R. Zeisel | S. Baldovino | O. Ambacher | M. S. Brandt | M. Stutzmann

Generation-recombination noise of DX centers in AlN : Si

APPLIED PHYSICS LETTERS 79 15 2396-2398 (2001)

S. T. B. Goennenwein | R. Zeisel | O. Ambacher | M. S. Brandt | M. Stutzmann | S. Baldovino

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TUM Technische Universität München TUM Technische Universität München Physik Department Elektrotechnik und Informationstechnik TUM Technische Universität München
 

News at the WSI

01 Apr 2013

Prof. Dr. Jonathan J. Finley new head of chair E24 - Prof. Dr. Gerhard Abstreiter new director of TUM-IAS   more

07 Jan 2013

Bavarian Academy of Sciences awards Robert-Sauer prize to Dr. Ulrich Rant   more

29 Oct 2012

Anouncement: A scientific symposium in memory of Professor Dr. Frederick Koch on November 23.   more

25 Sep 2012

ERC Grant for Prof. Alexander Holleitner (WSI and Physik-Department, TUM)   more

14 Sep 2012

Best Student paper award for Tobias Gruendl   more

 
 
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